DMILL & AMS pixel analog front-end

five groups:

• 'DMILL' Charge Sensitive Amplifier ( Description, Measurement and Irradiation )
  1. Advantages of this new DC feedback technique
  2. Dynamic behaviour after high level of irradiation

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• 'DMILL' Pixel Cell ( Measurement before and after proton irradiation )
  1. Threshold versus dose
  2. Evolution of Time Walk at different doses

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• 'DMILL' 63*12 Pixel Array ( Description and Measurement before and after high level of proton irradiation )
  1. Description of the DMILL LEPTON Chip
  2. Efficiency and In Time response after 30 Mrad
  3. Layout of the Lepton cell (color)
  4. Layout of the Lepton cell (black&white)

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• Leakage current measurement on the 'BEER-and-PASTIS' chip.
  1. Amplitude deficit as a function of leakage current
  2. DC level shift as a function of leakage current

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• SEU measurements
  1. SEU measurement (slide)
  2. SEU measurement (figure)

These measurements have been performed on the 'MAREBO' chip during irradiation at CERN:

• SEU measurements on the 'DMILL MAREBO' shift register.
  1. ascii file of SEU measurements
  2. postcript file showing the SEU rate per bit versus fluence
  3. scope picture of an upset from 1 to 0
• I-V curves.
  1. I-V curves at 4Mrad
  2. I-V curves at 10Mrad
  3. I-V curves at 24Mrad
  4. I-V curves on the same plot
• beam and leak profile.
  1. beam profile 10/08/98 at 03H00
  2. beam profile 11/08/98 at 20H40
  3. leak profile 13/08/98 at 18H10

Simulation of parts of the DMILL demonstrator:

• LVDS driver number 1.
  1. Complete simulation (before and after irradiation) of one self-biased LVDS driver